System for the automatic testing of printed circuits
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 11, 1986
Grant Date -
N/A
app pub date -
Jul 22, 1983
filing date -
Jul 27, 1982
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The test system comprises a standard basic unit with a central unit, a read-only memory, a read/write memory for recording test programs transmitted from a bulk memory and interfaces; the basic unit is connected to the card to be tested via a specific unit corresponding to the card to be tested to allow the realization of a static test. The test system further comprises a simulation device including: microprocessor simulation means connected to the busses of the basic unit and to a gripper connectable to the terminals of a microprocessor of a card to be tested to allow a dynamic test of the card to be tested at the real speed of the microprocessor of said card; and a ROM simulation means connected to the busses of the basic unit and to a plug which can be mounted on a support of a ROM package unit on the card to be tested to allow a functional test of said card to be performed by causing the microprocessor of said card to execute a program loaded in said ROM simulation means.
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