Sample heater for use in microscopes

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4629862
SERIAL NO

06671732

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A heater for microscopes for heating a sample and maintaining the sample, which is mounted on a platform of the microscope, at a preset temperature during observation of the sample. The heater includes a platform for supporting thereon a sample container and a heater for heating at least part of the platform. A first heater box is fitted, open end down, over the platform and is connected thereto to form a first space which surrounds the sample container. A second heater box is then fitted over the first heater box in such a manner that a second space which surrounds the first heater box is formed. Heater means are provided for heating the second space. Accordingly, the temperatures in the first space and in the second space can be controlled independently to achieve better control over the temperature of the sample which is to be observed and to control condensation which may otherwise form in the sample holding container.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
OLYMPUS OPTICAL CO., LTD.TOKYO2102

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Endo, Itaru Hachioji, JP 13 247
Fujihara, Tadafumi Hachioji, JP 4 188
Inoue, Yasuo Hachioji, JP 191 2905
Kitagawa, Hisao Hachioji, JP 15 145
Shimada, Yoshihiro Hachioji, JP 56 600

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
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EVOTEC TECHNOLOGIES GMBH (2)
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THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE (1)
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DAKO DENMARK A/S (9)
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VENTANA MEDICAL SYSTEMS, INC. (22)
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THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY, DEPARTMENT OF HEALTH AND HUMAN SERVICES (2)
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DELAWARE CAPITAL FORMATION, INC. (1)
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FLUIDIGM CORPORATION (3)
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Grumman Aerospace Corporation (1)
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HIRATA CORPORATION (2)
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PANASONIC HEALTHCARE HOLDINGS CO., LTD. (1)
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* Cited By Examiner