Method and apparatus for particle irradiation of a target

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United States of America Patent

PATENT NO 4633090
SERIAL NO

06615971

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Abstract

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Method and apparatus for particle irradiation of a target, wherein the anisotropic contrast deflection of an irradiation modulator for producing the exposure pattern is produced step by step, the magnitude of the potential difference between the electrodes of a comb electrode is being set, and the structuring of a line probe is controlled by a control logic according to given specifications by utilization of potential setting patterns.

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Patent Owner(s)

Patent OwnerAddress
JENOPTIK JENA G M B H69 JENA 1 A GERMAN CORP CARL-ZEISS STRASSE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hahn, Eberhard Jena, DD 3 38

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