Apparatus and method for directly measuring the density of a thin layer

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4641030
SERIAL NO

06681302

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The present invention provides a nuclear radiation backscatter gauge which is capable of directly measuring the density of a thin top layer of material from a composite material comprised of the relatively thin top layer of material applied over an underlying base material. The gauge includes a nuclear radiation source and two radiation detector means so positioned with respect to the source as to form two geometrically differing source-to-detector relationships. A signal processing circuit responds to detected radiation from the two detector means to generate respective signals D.sub.G1 and D.sub.G2 representative of the components densities of the top and base layers as measured by the detector means. The density D.sub.T of the thin top layer is then determined by a signal processing means from the relationship ##EQU1## wherein k.sub.1 and k.sub.2 are empirically derived instrument constants.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
TROXLER ELCTRONIC LABORATORIES INCRESEARCH TRIANGLE PARK A NC CORP DURHAM NC

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Regimand, Ali Raleigh, NC 48 557

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation