Arrangement for scanned 3-D measurement
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United States of America Patent
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-
Feb 17, 1987
Grant Date -
N/A
app pub date -
Mar 4, 1985
filing date -
Mar 4, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Three-dimensional surface measurements are made in the presence of interfering background light such as weld arc glare by scanning the surface with a narrow light beam and synchronously masking the image of the illuminated surface to block all light within the area of expected light returned by the surface from the scanned light beam. The masking is moved synchronously across the image area as the expected returned light follows the scanned path of the scanning light beam. Masking is accomplished mechanically or by electro-optic devices.
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