US Patent No: 4,646,299

Number of patents in Portfolio can not be more than 2000

Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits

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ATTORNEY / AGENT: (SPONSORED)
 

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Abstract

A plurality of test signal applying and monitoring circuits are coupled to pins of an electronic device being tested to force test stimuli signals onto input pins of the device under test. The response signals are monitored while the device is being tested. Each test signal applying and monitoring circuit includes a node to be coupled to a pin of the device under test, a digitally programmed source for supplying a test signal connectable to the node by a first switch, and a comparison circuit connected to the node by a second switch for indicating the relative amplitude of the response signal with respect to a programmed reference level. The digitally programmed source is included for providing gated voltage-current crossover forcing functions during functional testing to minimize the disturbance when the device being tested is connected and to protect out of tolerance devices. Programmable voltage and current values define a pass window to assure a non-ambiguous go/no-go result during testing. Other features are also disclosed.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FAIRCHILD CAMERA & INSTRUMENT CORP.MOUNTAIN VIEW, CA251
NATIONAL SEMICONDUCTOR CORPORATIONSANTA CLARA, CA4706
SCHLUMBERGER SYSTEMS AND SERVICES, INC.SUNNYVALE, CA68

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Murdock, James R Tolland, CT 7 158
Schinabeck, John Pleasanton, CA 3 226

Cited Art

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ZEHNTEL, INC. (1)
4,439,858 Digital in-circuit tester 59 1981

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