US Patent No: 4,646,299

Number of patents in Portfolio can not be more than 2000

Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A plurality of test signal applying and monitoring circuits are coupled to pins of an electronic device being tested to force test stimuli signals onto input pins of the device under test. The response signals are monitored while the device is being tested. Each test signal applying and monitoring circuit includes a node to be coupled to a pin of the device under test, a digitally programmed source for supplying a test signal connectable to the node by a first switch, and a comparison circuit connected to the node by a second switch for indicating the relative amplitude of the response signal with respect to a programmed reference level. The digitally programmed source is included for providing gated voltage-current crossover forcing functions during functional testing to minimize the disturbance when the device being tested is connected and to protect out of tolerance devices. Programmable voltage and current values define a pass window to assure a non-ambiguous go/no-go result during testing. Other features are also disclosed.

Loading the Abstract Image... loading....

First Claim

See full text

all claims..

Related Publications

Loading Related Publications... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
FAIRCHILD CAMERA AND INSTRUMENT CORPORATIONMOUNTAIN VIEW, CA251
NATIONAL SEMICONDUCTOR CORPORATIONSANTA CLARA, CA4800
SCHLUMBERGER SYSTEMS AND SERVICES, INC.SUNNYVALE, CA68

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Murdock, James R Tolland, CT 16 162
Schinabeck, John Pleasanton, CA 3 231

Cited Art Landscape

Patent Info (Count) # Cites Year
 
FLUKE CORPORATION (1)
4,271,515 Universal analog and digital tester 16 1979
 
MEGATEST CORPORATION (1)
4,517,512 Integrated circuit test apparatus test head 105 1982
 
Takeda Riken Kogyo Kabushikikaisha (1)
4,523,312 IC tester 39 1982
 
Zehntel, Inc. (1)
4,439,858 Digital in-circuit tester 59 1981

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
MICRON TECHNOLOGY, INC. (16)
5,913,020 Method for using fuse identification codes for masking bad bits on single in-line memory modules 16 1997
7,065,682 Method for monitoring tests run on a personal computer 0 1997
6,441,627 Socket test device for detecting characteristics of socket signals 6 1998
6,496,876 System and method for storing a tag to identify a functional storage location in a memory device 3 1998
6,202,030 Calibrating test equipment 3 1999
6,578,157 Method and apparatus for recovery of useful areas of partially defective direct rambus rimm components 5 2000
7,269,765 Method and apparatus for storing failing part locations in a module 49 2000
6,810,492 Apparatus and system for recovery of useful areas of partially defective direct rambus RIMM components 3 2003
7,328,381 Testing system and method for memory modules having a memory hub architecture 10 2005
7,319,340 Integrated circuit load board and method having on-board test circuit 22 2005
7,765,424 System and method for injecting phase jitter into integrated circuit test signals 0 2005
7,355,387 System and method for testing integrated circuit timing margins 4 2005
7,284,169 System and method for testing write strobe timing margins in memory devices 4 2005
7,890,819 Method and apparatus for storing failing part locations in a module 0 2007
7,521,948 Integrated circuit load board and method having on-board test circuit 0 2007
7,619,404 System and method for testing integrated circuit timing margins 1 2007
 
TEXAS INSTRUMENTS INCORPORATED (11)
5,265,101 Function array sequencing for VLSI test system 2 1989
4,928,062 Loading and accurate measurement of integrated dynamic parameters at point of contact in automatic device handlers 19 1989
6,728,915 IC with shared scan cells selectively connected in scan path 10 2001
6,769,080 Scan circuit low power adapter with counter 9 2001
7,058,862 Selecting different 1149.1 TAP domains from update-IR state 10 2001
6,763,485 Position independent testing of circuits 15 2002
6,975,980 Hierarchical linking module connection to access ports of embedded cores 4 2002
6,996,761 IC with protocol selection memory coupled to serial scan path 2 2003
6,990,620 Scanning a protocol signal into an IC for performing a circuit operation 1 2003
7,058,871 Circuit with expected data memory coupled to serial input lead 3 2003
6,898,544 Instruction register and access port gated clock for scan cells 1 2004
 
TERADYNE, INC. (7)
5,596,587 Method and apparatus for preparing in-circuit test vectors 29 1993
5,682,392 Method and apparatus for the automatic generation of boundary scan description language files 33 1996
6,133,725 Compensating for the effects of round-trip delay in automatic test equipment 28 1998
6,194,910 Relayless voltage measurement in automatic test equipment 6 1998
6,374,379 Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment 8 1999
7,216,273 Method for testing non-deterministic device data 8 2003
7,403,030 Using parametric measurement units as a source of power for a device under test 2 2004
 
ROUND ROCK RESEARCH, LLC (5)
6,332,183 Method for recovery of useful areas of partially defective synchronous memory components 3 1998
6,314,527 Recovery of useful areas of partially defective synchronous memory components 3 1998
6,381,707 System for decoding addresses for a defective memory array 12 1998
6,381,708 Method for decoding addresses for a defective memory array 4 1998
6,621,748 Recovery of useful areas of partially defective synchronous memory components 0 2001
 
XCERRA CORPORATION (5)
5,225,772 Automatic test equipment system using pin slice architecture 28 1990
5,212,443 Event sequencer for automatic test equipment 40 1990
6,563,298 Separating device response signals from composite signals 9 2000
6,703,825 Separating device response signals from composite signals 6 2003
8,295,182 Routed event test system and method 0 2008
 
AGILENT TECHNOLOGIES, INC. (4)
5,293,374 Measurement system control using real-time clocks and data buffers 14 1992
5,578,932 Method and apparatus for providing and calibrating a multiport network analyzer 145 1995
5,552,714 Electronic calibration method and apparatus 28 1995
7,739,070 Standardized interfaces for proprietary instruments 0 2007
 
SYNOPSYS, INC. (4)
5,353,243 Hardware modeling system and method of use 33 1992
5,625,580 Hardware modeling system and method of use 44 1994
5,673,295 Method and apparatus for generating and synchronizing a plurality of digital signals 16 1995
6,148,275 System for and method of connecting a hardware modeling element to a hardware modeling system 1 1997
 
DELTA DESIGN, INC. (3)
6,476,627 Method and apparatus for temperature control of a device during testing 60 1996
6,650,132 Method and apparatus for temperature control of a device during testing 9 2002
6,788,084 Temperature control of electronic devices using power following feedback 5 2002
 
FAIRCHILD SEMICONDUCTOR CORPORATION (3)
5,101,153 Pin electronics test circuit for IC device testing 71 1991
5,414,352 Parametric test circuit with plural range resistors 11 1993
5,377,202 Method and apparatus for limiting pin driver offset voltages 16 1993
 
FormFactor, Inc. (3)
6,812,691 Compensation for test signal degradation due to DUT fault 69 2002
7,245,120 Predictive, adaptive power supply for an integrated circuit under test 3 2005
7,714,603 Predictive, adaptive power supply for an integrated circuit under test 3 2007
 
FREESCALE SEMICONDUCTOR, INC. (3)
5,467,024 Integrated circuit test with programmable source for both AC and DC modes of operation 85 1993
5,617,035 Method for testing integrated devices 109 1995
8,531,197 Integrated circuit die, an integrated circuit package and a method for connecting an integrated circuit die to an external device 1 2008
 
ADVANTEST (SINGAPORE) PTE LTD (2)
5,579,236 Voltage/current measuring unit and method 12 1996
6,639,397 Automatic test equipment for testing a device under test 20 2001
 
ADVANTEST CORPORATION (2)
7,839,158 Method of detecting abnormality in burn-in apparatus 0 2005
7,802,160 Test apparatus and calibration method 0 2007
 
INTEL CORPORATION (2)
4,983,907 Driven guard probe card 72 1989
6,732,053 Method and apparatus for controlling a test cell 3 1998
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (2)
5,761,214 Method for testing integrated circuit devices 3 1992
8,645,774 Expedited memory drive self test 0 2011
 
MCGILL UNIVERSITY (2)
6,727,834 Method and device for use in DC parametric tests 3 2003
6,917,320 Method and device for use in DC parametric tests 1 2004
 
ADC TELECOMMUNICATIONS, INC. (1)
6,876,206 Automatic jack tester 0 2002
 
ALTERA CORPORATION (1)
5,493,519 High voltage driver circuit with fast current limiting for testing of integrated circuits 7 1993
 
Amdahl Corporation (1)
5,210,832 Multiple domain emulation system with separate domain facilities which tests for emulated instruction exceptions before completion of operand fetch cycle 24 1991
 
ANALOG DEVICES, INC. (1)
5,010,297 Automatic test equipment with active load having high-speed inhibit mode switching 9 1989
 
AT&T CORP. (1)
5,392,293 Built-in current sensor for I.sub.DDQ testing 59 1993
 
B-Tree Verification Systems, Inc. (1)
5,740,352 Liquid-crystal display test system and method 14 1995
 
BIOMATION CORPORATION (1)
4,771,428 Circuit testing system 24 1986
 
CARNEGIE MELLON UNIVERSITY (1)
5,025,344 Built-in current testing of integrated circuits 57 1990
 
CSELT - CENTRO STUDI E LABORATORI TELECOMUNICAZIONI S.P.A. (1)
6,194,909 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system 3 1998
 
EMC CORPORATION (1)
6,396,256 Power supply slew time testing of electronic circuits 1 1998
 
EXAMINER SYSTEMS, INC. (1)
4,827,437 Auto calibration circuit for VLSI tester 28 1986
 
FACEBOOK, INC. (1)
6,054,863 System for testing circuit board integrity 4 1996
 
FAIRFIELD SEMICONDUCTOR (1)
5,842,155 Method and apparatus for adjusting pin driver charging and discharging current 12 1993
 
GENERAL ELECTRIC COMPANY (1)
7,969,171 Test circuit and system 0 2010
 
Grumman Aerospace Corporation (1)
5,390,194 ATG test station 13 1993
 
HON HAI PRECISION INDUSTRY CO., LTD. (1)
7,681,081 Test device and method for testing stability of computer 2 2006
 
INTERGRAPH SOFTWARE TECHNOLOGIES COMPANY (1)
5,047,971 Circuit simulation 32 1989
 
KEITHLEY INSTRUMENTS, INC. (1)
7,724,017 Multi-channel pulse tester 0 2006
 
LSI LOGIC CORPORATION (1)
6,101,458 Automatic ranging apparatus and method for precise integrated circuit current measurements 4 1997
 
MDS CO. LTD. (1)
7,129,719 Apparatus for detecting defect in circuit pattern and defect detecting system having the same 1 2004
 
MENTOR GRAPHICS CORPORATION (1)
6,885,213 Circuit and method for accurately applying a voltage to a node of an integrated circuit 16 2003
 
NATIONAL INSTRUMENTS CORPORATION (1)
5,648,918 Calibration of a plurality of excitation sources for an instrumentation system 12 1995
 
NATIONAL SEMICONDUCTOR CORPORATION (1)
5,286,656 Individualized prepackage AC performance testing of IC dies on a wafer using DC parametric test patterns 77 1992
 
NORTHROP GRUMMAN CORPORATION (1)
4,849,847 Power supply switch for wafer scale applications 20 1987
 
PHOTON DYNAMICS, INC. (1)
4,875,006 Ultra-high-speed digital test system using electro-optic signal sampling 48 1988
 
QIMONDA AG (1)
6,842,712 Method for testing an electronic component; computer program product, computer readable medium, and computer embodying the method; and method for downloading the program embodying the method 0 2003
 
SANDIA CORPORATION (1)
6,031,386 Apparatus and method for defect testing of integrated circuits 12 1997
 
SCHLUMBERGER AUTOMATED TEST EQUIPMENT (1)
6,489,793 Temperature control of electronic devices using power following feedback 69 1999
 
SCHLUMBERGER TECHNOLOGIES, INC. (1)
4,994,732 Automatic test system having a "true tester-per-pin" architecture 37 1989
 
SUN MICROSYSTEMS, INC. (1)
7,055,135 Method for debugging an integrated circuit 1 2002
 
SV PROBE PTE LTD. (1)
5,973,504 Programmable high-density electronic device testing 99 1997
 
TEKTRONIX, INC. (1)
7,685,479 Telecommunications network testing 1 2006
 
VERIGY (SINGAPORE) PTE. LTD. (1)
7,231,573 Delay management system 1 2002
 
WISTRON CORPORATION (1)
8,306,770 Method, system and test platform for testing output of electrical device 0 2010
 
YOKOGAWA ELECTRIC CORPORATION (1)
6,198,699 Semiconductor testing apparatus 1 1998
 
Other [Check patent profile for assignment information] (4)
4,707,849 High speed automatic test apparatus especially for electronic directory terminals 6 1986
5,060,177 Test circuit for automatic transmission 9 1990
5,459,738 Apparatus and method for digital circuit testing 4 1994
6,988,229 Method and apparatus for monitoring and controlling boundary scan enabled devices 6 2002