Selective gas detector
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United States of America Patent
Stats
-
Mar 3, 1987
Grant Date -
N/A
app pub date -
May 31, 1985
filing date -
May 31, 1985
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A selective infra-red detector is used to determine the amount of a selected gas present in a gas sample. A beam of infra-red energy is passed through a gas sample and into the selective infra-red detector. An outer annular portion of the beam is reflected from a paraboloidal mirror onto a first focal point, while an inner annular portion of the beam passes through a chamber containing a fluid which will absorb the spectral wavelengths of the selected gas and is reflected by a spherical mirror onto a second focal point. Separate infra-red energy detectors are positioned near the first and second focal points to measure the infra-red energy. The difference or ratio between the infra-red energy measured by each infra-red energy detector is a measure of the amount of selected gas present in the gas sample.
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