Examination method and apparatus utilizing nuclear magnetic resonance

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United States of America Patent

PATENT NO 4651097
SERIAL NO

06659409

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In an examination method and apparatus utilizing nuclear magnetic resonance, high frequency pulses for producing nuclear magnetic resonance are applied by successively imposing a first 90.degree. pulse, a first 180.degree. pulse, a second 90.degree. pulse, and a second 180.degree. pulse substantially immediately after the second 90.degree. pulse, and a next pulse sequence is initiated upon elapse of a wait time after the second 180.degree. pulse has been applied. The wait time is rendered much shorter than the conventional prior art wait times for high speed scanning operation, by forcibly aligning magnetization M first with the direction of a -Z direction axis and then with the direction of a +Z direction axis, using the second 90.degree. pulse and the second 180.degree. pulse. By applying a number of first 180.degree. pulses, a number of nuclear magentic resonance signals are produced for additionally shortening the overall measurement time.

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Patent Owner(s)

Patent OwnerAddress
YOKOGAWA ELECTRIC CORPORATION9-32 NAKACHO 2-CHOME MUSASHINO-SHI TOKYO 180

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iwaoka, Hideto Tokyo, JP 25 580
Matsuura, Hiroyuki Tokyo, JP 122 1565
Sugiyama, Tadashi Tokyo, JP 76 1233

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