Apparatus and method for obtaining three dimensional surface contours

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United States of America Patent

PATENT NO 4657394
SERIAL NO

06753722

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Abstract

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Phase measurements of deformed grating images are used in performing improved optical profilometry. Individual line profiles are obtained at a series of rotational increments of a body. A full 360 degree surface profile, or a portion thereof, can then be generated.

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Patent Owner(s)

Patent OwnerAddress
NEW YORK INSTITUTE OF TECHNOLOGY A CORP OF NEW YORKWHEATLEY ROAD OLD WESTBURY NY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Halioua, Maurice Sea Cliff, NY 7 374

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