Plasma developable negative resist compositions for electron beam, X-ray and optical lithography

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United States of America Patent

PATENT NO 4657844
SERIAL NO

06734357

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Abstract

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A negative resist composition including a polymeric matrix material, a polymerizable monomer, and an onium salt radiation sensitive initiator. The monomer is polymerized by irradiating the resist with an e-beam, x-ray, or ultraviolet source and heating the exposed resist. The resist is developed by a dry etchant such as plasma or a reactive ion etchant.

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Patent Owner(s)

  • TEXAS INSTRUMENTS INCORPORATED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Covington, Johnny B Richardson, TX 1 8
Lee, Wei Richardson, TX 37 134
Shu, Jing S Plano, TX 3 43
Varnell, Gilbert L Dallas, TX 2 42
Venable, Larry G Grand Prairie, TX 10 54

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