Emissivity error correcting method for radiation thermometer
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United States of America Patent
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Apr 21, 1987
Issued Date -
N/A
app pub date -
Apr 7, 1986
filing date -
Jun 18, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of more accurately measuring the true surface temperature of metal alloy objects without contacting the same. The surfaces of the objects have unknown emissivities that change and that are less than unity. The method includes the step of providing objects having surfaces that radiate infrared energy. The radiated energy is measured at two wavelengths, and a first measurement is provided that is a function of the ratio of the energies at the two wavelengths. The radiated energy is also measured at a single, narrow band wavelength, and a second measurement is provided that is a function of the radiated energy. The two measurements are then electrically combined to provide measurements of radiated energy and thus temperature measurements that are or at least are closer to the true temperature than either of the first or second measurements.
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