Low noise test contacts for pin grid array
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 26, 1987
Issued Date -
N/A
app pub date -
Aug 28, 1986
filing date -
Apr 19, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus for providing an electrical connection between a packaged semiconductor device and a device tester. The apparatus utilizes pogo pins as contactors. The pins are located in a pair of plates, one plate acting as a power source, the other as a ground. A dielectric layer between the plates allows them to act as a charge decoupling capacitor, resulting in a low noise contact.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully