Wave shape chemical analysis apparatus and method
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 14, 1987
Grant Date -
N/A
app pub date -
Sep 9, 1985
filing date -
Sep 9, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus and method for measuring the concentration of a chemical substance in a test sample based on a technique of waveform distortion analysis is disclosed. The apparatus includes a waveform generator that generates a periodic signal, an antenna probe that transmits the signal into the test sample and receives from the test sample a corresponding periodic signal, the waveform of which has been distorted or otherwise transformed by the chemical, and a detector circuit that quantifies the transformation of the signal to determine the concentration of the chemical in the test sample. The waveform shape and frequency are selected so that the transformation is particularly responsive to the presence of a selected chemical substance, so that the magnitude of the distortion or transformation of the signal is directly related to the concentration of the selected chemical substance.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully