Millimeter wave vector network analyzer
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United States of America Patent
Stats
-
Jul 14, 1987
Grant Date -
N/A
app pub date -
Jan 15, 1985
filing date -
Jan 15, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A vector network analyzer system for measuring the complex impedance of devices and components at millimeter wavelengths is disclosed. A pair of directional couplers provide samples of the signal incident on and reflected from the element under test through reference and test channels, respectively. A 180.degree. hybrid, or magic tee, device receives the samples, mixes them vectorially, and produces outputs to two power detectors which provide amplitude and phase information about the complex reflection coefficient. Similar measurements are obtained for the complex transmission coefficient. A 90.degree. phase shifter consisting of a second magic tee and a PIN diode is connected in the reference channel to eliminate a phase measurement ambiguity. A computer processes the power detector output to determine the value of the unknown impedence. An electronically swept signal source allows measurements to be made automatically over a wide frequency band.
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