High speed testing of electronic circuits by electro-optic sampling
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United States of America Patent
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Jul 21, 1987
Grant Date -
N/A
app pub date -
Sep 7, 1984
filing date -
Sep 7, 1984
priority date (Note) -
Expired
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Abstract
Non-contact measurement of signals up to and beyond 100 GHz is provided by electro-optical sampling the field in a transmission line. A first laser signal is employed to optically generate signals in a III-V compound semiconductor such as gallium arsenide. The signal is transmitted to microstrip on the semiconductor surface, and a second polarized laser signal is passed through the crystal and its polarization is modulated by the electric field in the microstrip. The polarization presents a measure of the field strength and hence the signal. By varying the relative delay between two beams, an equivalent time representation of the sampled signal is obtained.
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