Importance

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Abstract

A planar contact set for use in a test fixture for receiving an integrated circuit package for facilitating the electrical connection thereof to test equipment so that electrical and electronic tests can be performed on the integrated circuit. The contact set includes a flexible insulating support member having a central aperture which supports a plurality of conductive contact strips which extend over the aperture in cantilever fashion. The support member includes a support sheet underlying the contact strips and a retaining sheet overlying the contact strips, the sheets maintaining the strips in the proper position to contact the leads of the integrated circuit package when in a test registration position and also to enable electrical connections to be made to the test apparatus. In an exemplary test fixture, the contact member is supported between a lower support and an upper guide member, the guide member having a guide aperture over the central aperture of the contact member's support sheet to expose the contact strips. A ram holding an integrated circuit package lowers it through the guide aperture to an advanced test position with the leads extending from the integrated circuit package in electrical contact with the contact strips. At the end of a test, the ram retracts to remove the integrated circuit package. A mechanical ejector is provided to help force the package from the test position in the fixture if the ram is unable to remove it.

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First Claim