Integrated circuit tester and remote pin electronics therefor
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United States of America Patent
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-
Sep 15, 1987
Issued Date -
N/A
app pub date -
Jun 20, 1986
filing date -
Oct 1, 1984
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention relates, in general, to an electronic and measuirng circuits are located remotely from the test head. A low device count circuit at each pin performs the necessary high speed switching. The force and measure lines are relatively long, but the signal rates are low enough to be accurately transmitted. The only high rate signals are on lines coupled to the gates of FET switches at the test head. Thus, multiple pin, high speed testing can be accomplished using relatively small and inexpensive test heads.
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