Vacuum-actuated top access test probe fixture

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4694245
SERIAL NO

06648786

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A top access test probe fixture (10) for use with a vacuum-actuated primary test fixture (12) includes a probe block (70) supported for reciprocal movement on a contact board (54) mounted on the movable top platen (28) of the primary test fixture. The probe block (70) is actuated through bellows (86) disposed between the probe block and contact board (54), which bellows are connected in fluid communication with the vaccum chamber of the primary test fixture (12) so that the top access test fixture (10) is actuated simultaneously and responsive to actuation of the primary fixture. Contacts (102) are provided on the contact board (54) for engagement with probes (104) on the primary fixture (12) and probes (100) on the probe block (70) connected by leads (106) to other probes (108) on the probe block adapted for engagement with predetermined points on the top of the circuit board under test to avoid bending and thus fatigue and breakage of wires during operation.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
PRECISION DIVERSIFIED INDUSTRIES, INC.MINNETONKA, MN0

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Frommes, T Michael Minnetonka, MN 1 75

Cited Art Landscape

Patent Info (Count) # Cites Year
 
GENERAL ELECTRIC COMPANY (1)
* 4379992 Printed circuit board electronic tester 3 1981
 
VIRGINIA PANEL CORPORATION (1)
* 4344033 Vacuum-actuated test fixture for printed circuit boards 25 1980
 
Riba-Pruftechnik GmbH (1)
* 4551673 Testing arrangement for printed circuit boards 21 1981
 
UNISYS CORPORATION (1)
* 4362991 Integrated circuit test probe assembly 44 1980
* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (2)
* 2003/0092,300 Method for electrically connecting a circuit board connector to an external device 4 2002
* 2004/0061,514 Wafer probe station for low-current measurements 2 2003
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (2)
* 6051983 Positive side support test assembly 2 1997
6252413 Positive side support test assembly 0 1999
 
PNC NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT (1)
* 5892367 Thermal box for a semiconductor test system 7 1995
 
EVERETT/CHARLES CONTACT PRODUCTS, INC. (1)
* 5300881 Test fixture 23 1993
 
CRAY RESEARCH, INC. (1)
* 4962356 Integrated circuit test socket 28 1988
 
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP (1)
7307437 Arrangement with conductive pad embedment 2 2005
 
SIEMENS AKTIENGESELLSCHAFT (1)
* 4841241 Testing device for both-sided contacting of component-equipped printed circuit boards 18 1987
 
CASCADE MICROTECH, INC. (65)
* 5532609 Wafer probe station having environment control enclosure 70 1995
* 5604444 Wafer probe station having environment control enclosure 62 1996
6313649 Wafer probe station having environment control enclosure 57 1997
* 6002263 Probe station having inner and outer shielding 60 1997
* 5963027 Probe station having environment control chambers with orthogonally flexible lateral wall assembly 71 1997
6252392 Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly 51 1999
6288557 Probe station having inner and outer shielding 51 1999
6380751 Wafer probe station having environment control enclosure 49 2001
6362636 Probe station having multiple enclosures 53 2001
6489789 Probe station having multiple enclosures 50 2001
6486687 Wafer probe station having environment control enclosure 51 2002
6636059 Wafer probe station having environment control enclosure 49 2002
6639415 Probe station having multiple enclosures 49 2002
6801047 Wafer probe station having environment control enclosure 47 2003
6842024 Probe station having multiple enclosures 47 2003
* 2004/0027,144 Probe station having multiple enclosures 0 2003
7138813 Probe station thermal chuck with shielding for capacitive current 14 2003
7250779 Probe station with low inductance path 24 2003
7368925 Probe station with two platens 9 2004
7250626 Probe testing structure 4 2004
7221172 Switched suspended conductor and connection 23 2004
7492172 Chuck for holding a device under test 5 2004
7268533 Optical testing device 4 2004
7009383 Wafer probe station having environment control enclosure 93 2004
7187188 Chuck with integrated wafer support 79 2004
7190181 Probe station having multiple enclosures 8 2004
* 2005/0062,489 Probe station having multiple enclosures 0 2004
7138810 Probe station with low noise characteristics 11 2004
7221146 Guarded tub enclosure 7 2005
7589518 Wafer probe station having a skirting component 5 2005
7554322 Probe station 6 2005
7330041 Localizing a temperature of a device for testing 7 2005
7330023 Wafer probe station having a skirting component 4 2005
7176705 Thermal optical chuck 3 2005
7352168 Chuck for holding a device under test 9 2005
7164279 System for evaluating probing networks 2 2005
7348787 Wafer probe station having environment control enclosure 5 2005
7656172 System for testing semiconductors 6 2006
7535247 Interface for testing semiconductors 5 2006
7295025 Probe station with low noise characteristics 6 2006
7292057 Probe station thermal chuck with shielding for capacitive current 3 2006
7504823 Thermal optical chuck 4 2006
7321233 System for evaluating probing networks 12 2007
7362115 Chuck with integrated wafer support 14 2007
7639003 Guarded tub enclosure 2 2007
7468609 Switched suspended conductor and connection 4 2007
8069491 Probe testing structure 2 2007
7498828 Probe station with low inductance path 5 2007
7436170 Probe station having multiple enclosures 3 2007
7492147 Wafer probe station having a skirting component 4 2007
7550984 Probe station with low noise characteristics 4 2007
7616017 Probe station thermal chuck with shielding for capacitive current 2 2007
7688062 Probe station 0 2007
7969173 Chuck for holding a device under test 2 2007
7518358 Chuck for holding a device under test 12 2007
7514915 Chuck for holding a device under test 10 2007
7501810 Chuck for holding a device under test 11 2007
7423419 Chuck for holding a device under test 9 2007
7626379 Probe station having multiple enclosures 16 2007
7595632 Wafer probe station having environment control enclosure 5 2008
7688091 Chuck with integrated wafer support 1 2008
7898281 Interface for testing semiconductors 3 2008
7876115 Chuck for holding a device under test 2 2009
8319503 Test apparatus for measuring a characteristic of a device under test 2 2009
7940069 System for testing semiconductors 3 2009
 
DELAWARE CAPITAL FORMATION, INC. (1)
* 5200694 Head assembly for printed circuit board test fixture 6 1992
 
DELTA DESIGN, INC. (1)
6864678 Nestless plunge mechanism for semiconductor testing 0 2003
 
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
* 4935694 Probe card fixture 5 1988
 
AGILENT TECHNOLOGIES, INC. (1)
* 6751856 Method for electrically connecting a circuit board connector to an external device 5 2002
 
Sigmatech Co., Ltd. (1)
* 5218292 Apparatus for inspecting internal circuit of semiconductor device 19 1991
* Cited By Examiner