US Patent No: 4,694,245

Number of patents in Portfolio can not be more than 2000

Vacuum-actuated top access test probe fixture

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Abstract

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A top access test probe fixture (10) for use with a vacuum-actuated primary test fixture (12) includes a probe block (70) supported for reciprocal movement on a contact board (54) mounted on the movable top platen (28) of the primary test fixture. The probe block (70) is actuated through bellows (86) disposed between the probe block and contact board (54), which bellows are connected in fluid communication with the vaccum chamber of the primary test fixture (12) so that the top access test fixture (10) is actuated simultaneously and responsive to actuation of the primary fixture. Contacts (102) are provided on the contact board (54) for engagement with probes (104) on the primary fixture (12) and probes (100) on the probe block (70) connected by leads (106) to other probes (108) on the probe block adapted for engagement with predetermined points on the top of the circuit board under test to avoid bending and thus fatigue and breakage of wires during operation.

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First Claim

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all claims..

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Patent Owner(s)

Patent OwnerAddressTotal Patents
PRECISION DIVERSIFIED INDUSTRIES, INC.MINNETONKA, MN0

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Frommes, T Michael Minnetonka, MN 1 75

Cited Art Landscape

Patent Info (Count) # Cites Year
 
GENERAL ELECTRIC COMPANY (1)
* 4,379,992 Printed circuit board electronic tester 3 1981
 
RIBA-PRUFTECHNIK GMBH, A COMPANY OF GERMANY (1)
* 4,551,673 Testing arrangement for printed circuit boards 21 1981
 
UNISYS CORPORATION (1)
* 4,362,991 Integrated circuit test probe assembly 44 1980
 
Virginia Panel Corporation (1)
* 4,344,033 Vacuum-actuated test fixture for printed circuit boards 24 1980
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
CASCADE MICROTECH, INC. (63)
* 5,532,609 Wafer probe station having environment control enclosure 70 1995
* 5,604,444 Wafer probe station having environment control enclosure 62 1996
6,313,649 Wafer probe station having environment control enclosure 55 1997
* 6,002,263 Probe station having inner and outer shielding 59 1997
* 5,963,027 Probe station having environment control chambers with orthogonally flexible lateral wall assembly 71 1997
6,252,392 Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly 51 1999
6,288,557 Probe station having inner and outer shielding 51 1999
6,380,751 Wafer probe station having environment control enclosure 49 2001
6,362,636 Probe station having multiple enclosures 53 2001
6,489,789 Probe station having multiple enclosures 50 2001
6,486,687 Wafer probe station having environment control enclosure 50 2002
6,636,059 Wafer probe station having environment control enclosure 49 2002
6,639,415 Probe station having multiple enclosures 49 2002
6,801,047 Wafer probe station having environment control enclosure 47 2003
6,842,024 Probe station having multiple enclosures 47 2003
7,138,813 Probe station thermal chuck with shielding for capacitive current 14 2003
7,250,779 Probe station with low inductance path 23 2003
7,368,925 Probe station with two platens 4 2004
7,250,626 Probe testing structure 4 2004
7,221,172 Switched suspended conductor and connection 23 2004
7,492,172 Chuck for holding a device under test 4 2004
7,268,533 Optical testing device 3 2004
7,009,383 Wafer probe station having environment control enclosure 92 2004
7,187,188 Chuck with integrated wafer support 76 2004
7,190,181 Probe station having multiple enclosures 5 2004
7,138,810 Probe station with low noise characteristics 8 2004
7,221,146 Guarded tub enclosure 5 2005
7,589,518 Wafer probe station having a skirting component 5 2005
7,554,322 Probe station 5 2005
7,330,041 Localizing a temperature of a device for testing 7 2005
7,330,023 Wafer probe station having a skirting component 4 2005
7,176,705 Thermal optical chuck 3 2005
7,352,168 Chuck for holding a device under test 9 2005
7,164,279 System for evaluating probing networks 2 2005
7,348,787 Wafer probe station having environment control enclosure 4 2005
7,656,172 System for testing semiconductors 3 2006
7,535,247 Interface for testing semiconductors 3 2006
7,295,025 Probe station with low noise characteristics 6 2006
7,292,057 Probe station thermal chuck with shielding for capacitive current 3 2006
7,504,823 Thermal optical chuck 3 2006
7,321,233 System for evaluating probing networks 7 2007
7,362,115 Chuck with integrated wafer support 14 2007
7,639,003 Guarded tub enclosure 2 2007
7,468,609 Switched suspended conductor and connection 4 2007
8,069,491 Probe testing structure 0 2007
7,498,828 Probe station with low inductance path 5 2007
7,436,170 Probe station having multiple enclosures 3 2007
7,492,147 Wafer probe station having a skirting component 3 2007
7,550,984 Probe station with low noise characteristics 3 2007
7,616,017 Probe station thermal chuck with shielding for capacitive current 1 2007
7,688,062 Probe station 0 2007
7,969,173 Chuck for holding a device under test 1 2007
7,518,358 Chuck for holding a device under test 12 2007
7,514,915 Chuck for holding a device under test 10 2007
7,501,810 Chuck for holding a device under test 10 2007
7,423,419 Chuck for holding a device under test 9 2007
7,626,379 Probe station having multiple enclosures 3 2007
7,595,632 Wafer probe station having environment control enclosure 5 2008
7,688,091 Chuck with integrated wafer support 1 2008
7,898,281 Interface for testing semiconductors 0 2008
7,876,115 Chuck for holding a device under test 1 2009
8,319,503 Test apparatus for measuring a characteristic of a device under test 1 2009
7,940,069 System for testing semiconductors 1 2009
 
INTERNATIONAL BUSINESS MACHINES CORPORATION (2)
* 6,051,983 Positive side support test assembly 2 1997
6,252,413 Positive side support test assembly 0 1999
 
AGILENT TECHNOLOGIES, INC. (1)
* 6,751,856 Method for electrically connecting a circuit board connector to an external device 3 2002
 
Cray Research, Inc. (1)
* 4,962,356 Integrated circuit test socket 28 1988
 
DELAWARE CAPITAL FORMATION, INC. (1)
* 5,200,694 Head assembly for printed circuit board test fixture 6 1992
 
DELTA DESIGN, INC. (1)
6,864,678 Nestless plunge mechanism for semiconductor testing 0 2003
 
ELECTRO SCIENTIFIC INDUSTRIES, INC. (1)
* 4,935,694 Probe card fixture 5 1988
 
EVERETT/CHARLES CONTACT PRODUCTS, INC. (1)
* 5,300,881 Test fixture 20 1993
 
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (1)
7,307,437 Arrangement with conductive pad embedment 0 2005
 
PNC NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT (1)
* 5,892,367 Thermal box for a semiconductor test system 5 1995
 
SIEMENS AKTIENGESELLSCHAFT (1)
* 4,841,241 Testing device for both-sided contacting of component-equipped printed circuit boards 18 1987
 
Sigmatech Co., Ltd. (1)
* 5,218,292 Apparatus for inspecting internal circuit of semiconductor device 19 1991
* Cited By Examiner