Monolithic semiconductor integrated circuit with programmable elements for minimizing deviation of threshold value
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United States of America Patent
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-
Sep 22, 1987
Grant Date -
N/A
app pub date -
Dec 14, 1984
filing date -
Dec 17, 1983
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An integrated circuit includes a plurality of threshold-value compensatory programmable elements integrally incorporated into a semiconductor integrated circuit, wherein, during the inspection process after assembly, the programmable elements store stationary data related to varied threshold voltages occurred during assembly process so that the varied substrate bias voltages can be restored to an ideal level by applying compensations as required. This circuit is extremely advantageous in that it effectively compensates for even the slightest variation of the threshold voltage in the integrated circuit using its extremely simplified circuit configuration, and in light of the conventional tendency in which redundant circuits containing a variety of chip parts each having a substantial area are used, against the needs for high-density part installation, the circuit embodied by the present invention effectively and securely provides means for realizing higher yield of monolithic semiconductor integrated circuits.
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