Method and apparatus for the determination of the thickness of transparent layers of lacquer
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United States of America Patent
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Oct 27, 1987
Grant Date -
N/A
app pub date -
Mar 6, 1986
filing date -
Mar 15, 1985
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to a method and apparatus for the determination of the thickness of transparent, clear or colored, layers of lacquer on bright rolled, metallic foil or thin strip, in particular of aluminium or aluminium alloys, wherein the optical transmission factor (D) of the layer is determined. The attenuation of irradiated light reflected from the metallic surface disposed in an arched configuration is measured in the infrared to visible range after transmission through the layers of lacquer.
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