Non-destructive testing of cooled detector arrays
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United States of America Patent
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Nov 24, 1987
Grant Date -
N/A
app pub date -
Jan 9, 1986
filing date -
Jan 9, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus for testing an array of infrared detectors includes a number of optical switches, each of which is individually addressable with light to change its electrical characteristics. Each of the optical switches has a first side and a second side. The first side of each optical switch is adapted to receive a detector of the infrared detector array to be tested. The apparatus also includes an electrode coupled to the second side of each optical switch. Further, the apparatus includes a detector circuit coupled to the electrode and to a probe adapted to be coupled to the infrared detector array for detecting changes in the electrical characteristics of the optical switches and the infrared detector elements in response to light addressing the individual test elements.
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