Apparatus and method for testing outputs of logic circuits by modulating optical sequals
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United States of America Patent
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Dec 22, 1987
Grant Date -
N/A
app pub date -
Aug 18, 1986
filing date -
Aug 18, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Compressive, multiplicative electrical-optical system for testing high-speed, large scale logic devices. The output signals of the device are changed into optical signals which are applied to optical guided-wave light intensity modulators. Electrical reference signals of the desired, or correct, outputs are applied to the modulators to control the light passing through the modulators. The system provides a product of the actual output signal and the complement of the electrical reference signal, and a product of the complemented optical output signal and the uncomplemented electrical reference signal. The light output from the modulators during the formation of the two products is observed, with a detection of light from either product indicating that an error exists in an output channel of the device. Parallel, or simultaneous, product formation is provided in one embodiment, and sequential, or time spaced product formation, is provided in another embodiment. An acousto-optic implementation of the invention is also described.
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