Optic element testing method and apparatus
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United States of America Patent
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-
Feb 16, 1988
Grant Date -
N/A
app pub date -
Feb 25, 1986
filing date -
Feb 25, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A system is described for testing aspheric optic elements by the interference of light beam components that are respectively directed to the element to be tested and to a reference element, which facilitates the testing. A reference element is deformable in a controlled manner to more closely match the element to be tested, to produce straighter and more even fringes.
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Cited Art Landscape
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