Electron-beam probing of photodiodes
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 8, 1988
Grant Date -
N/A
app pub date -
Jun 6, 1986
filing date -
Jun 6, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Method and apparatus for testing photodiode arrays using an electron beam. The diodes are charged at successive intervals over the RC time constant curve to develop successively increasing voltages at the ends of succeeding time intervals. Diode voltage and current are measured at the end of each interval and the resulting data are used to develop a current-voltage characteristic for each diode.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully