Temperature control for device under test
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United States of America Patent
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-
Mar 29, 1988
Grant Date -
N/A
app pub date -
Apr 30, 1985
filing date -
Apr 30, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A system for and method of precisely controlling the temperature of an electronic component through a range of temperatures by controlling the temperature of a gas forced into contact with the component is disclosed. The system comprises a dual control loop including two sensors, one for measuring the temperature of the gas and the other for sensing the temperature of the component, for controlling the temperature of the gas so as to provide accurate control of the temperature of the component.
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