Lean testing of electrical or electrical components
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United States of America Patent
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-
Apr 12, 1988
Grant Date -
N/A
app pub date -
Jul 7, 1986
filing date -
Jul 4, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method of leak testing electrical or electronic components, by immersion in an inert liquid at a temperature above 100.degree. C., to detect any bubbles arising from the component, after which the component is removed from the liquid and drained, wherein according to the invention the liquid in which the component to be tested is immersed comprises predominantly perfluoroperhydrofluorene, C.sub.13 F.sub.22.
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