Surface mensuration sensor
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United States of America Patent
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-
Apr 12, 1988
Grant Date -
N/A
app pub date -
Aug 26, 1985
filing date -
Aug 26, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The invention is an apparatus having an improved arrangement of sensing and illumination elements for high speed, non-contact, three-dimensional mensuration of a surface. The surface is illuminated by a single plane of light producing a contour line. The line is viewed from two or more vantage points, alleviating shadowing from many types of large surface irregularities. The geometry of the apparatus is tolerant of moving surfaces, allows higher data rates and has great depth of field for the sensor.
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