Telescoping pin probe
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 19, 1988
Grant Date -
N/A
app pub date -
Aug 1, 1986
filing date -
Aug 1, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe for use in electrical circuit test equipment, in which a contact element is longitudinally slidable in an insulator sleeve which also contains an R-C attenuator circuit connected electrically to the contact element by an electrically conductive elastomeric material. A high impedance cable is connected electrically to the other end of the RC attenuator circuit by another piece of conductive elastomeric material. The cable connects the attenuator to another R-C circuit which, together with the attenuator, forms a voltage divider, and the attenuated signal controls an amplifier which provides a signal through a low impedance cable to a test equipment.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully