Diagnosing method for logic circuits
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United States of America Patent
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-
May 10, 1988
Grant Date -
N/A
app pub date -
Nov 26, 1986
filing date -
Nov 26, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In a logic circuit which is logically divided into partial circuits each consisting of a logic block, data holding stages on the input and output sides therof, and a scan circuit segment associated with them, diagnostic data for a logic circuit section is obtained using the scan circuit segments in the respective partial circuits and wherein, only the scan circuit segments in the respective partial circuits are actuated to set values in the output side data holding stages and to read out the contents thereof as diagnostic test data for a scan circuit section.
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