Semiconductor integrated circuit including circuit elements evaluating the same and having means for testing the circuit elements
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United States of America Patent
Stats
-
May 10, 1988
Grant Date -
N/A
app pub date -
May 16, 1986
filing date -
May 20, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor integrated circuit including at lease one circuit (6, 8, 9, 71, 72, 104 to 106, 118, 119), at least one evaluating circuit element (10, 11, 12), a plurality of bonding pads (31 to 39) operatively connectable to the circuit and the evaluating circuit element, and a circuit for selectively connecting between the circuit and the bonding pads and between the evaluating circuit element and the bonding pads operatively connectable to the circuit. The selectively connecting circuit includes switching circuits (41 to 49) provided between the bonding pads and the evaluating circuit element and switching the connection between the bonding pads and the evaluating circuit element in response to a control signal. The semiconductor intergrated circuit may further include a circuit (Q.sub.11, Q.sub.12, 25, 58, 59) for controlling the at least one circuit to have a high impedance as seen from the bonding pads, in response to the control signal. The selectively connecting circuit may further include a circuit (2, 2') for outputting the control signal in response to reception of a test request signal.
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