Device for measuring the thickness of thin metallic layers deposited on a conductive support
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United States of America Patent
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Jun 21, 1988
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N/A
app pub date -
Oct 24, 1985
filing date -
Oct 24, 1984
priority date (Note) -
Expired
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Abstract
A method and apparatus for measuring the thickness of thin metallic layers deposited on a conductive support, wherein the thickness is determined from the measurement of the losses corresponding to the Joule effect, due to the eddy currents which appear when a magnetic circuit excited by an alternating voltage is brought close to the metallic surface.
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