Deposition and planarizing methods and apparatus

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United States of America Patent

PATENT NO 4756810
SERIAL NO

06938043

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Abstract

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A layer of a substance such as an aluminum alloy is deposited, preferably by sputtering, onto a surface of a substrate such as a semiconductor wafer. The deposited substance is redistributed by bombarding the layer with ions. The ion bombardment may be induced by applying low frequency RF excitation at about 5 KHz -1 MHz to the substrate.

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Patent Owner(s)

  • MIDLANTIC NATIONAL BANK;SOLITEC WAFER PROCESSING INC.;UNITED JERSEY BANK

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lamont, Jr Lawrence T San Jose, CA 12 750
McEntee, Timothy M Milpitas, CA 1 119
Mosely, Roderick C Mountain View, CA 35 2504

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