Probe system for measuring the condition of materials
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United States of America Patent
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-
Jul 12, 1988
Grant Date -
N/A
app pub date -
Oct 25, 1985
filing date -
Oct 25, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe comprises a plurality of longitudinally extended conductors forming a probe electrode, a laterally displaced ground electrode and two laterally displaced active guard electrodes interposed between the probe electrode and the ground electrode. The conductors are surrounded by solid insulation and the probe guard electrodes are driven at substantially the same potential as the probe electrode. The probe is utilized to measure the condition of materials in which the probe is immersed.
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