Importance

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Abstract

An apparatus for controlling the pressure exerted on a probe in an integrated circuit testing station is disclosed. The apparatus is mounted to a support structure within the station directly above the probe. The testing station further includes a motorized lift system for moving an integrated circuit upward against the probe for testing. The invention uses a pressure pad positioned directly above the probe which is attached to the support structure using a resilient member. Associated with the pad is an electrical contact system connected to the lift system. As the lift system moves the circuit upward, it contacts the probe which pushes against the pad. Movement of the probe and circuit against the pad permits secure engagement of the probe with the circuit. As the circuit continues to move upward, the pad is urged upward, causing the electrical contact system to deactivate the lift system before damage to the probe occurs.

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First Claim