Automatic test equipment for integrated circuits
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United States of America Patent
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-
Aug 9, 1988
Grant Date -
N/A
app pub date -
Sep 23, 1986
filing date -
Sep 23, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The apparatus (10) includes a semiconductor tester (12) which in operation produces an analog signature signal relative to a circuit node of an electronic circuit, such as a pin connection of an integrated circuit. The analog signature signal is the result of horizontal and vertical signals which are also directed to an integrator/A-D converter (44) which produces therefrom a set of four digital signals representing said analog signature. These digital signals are then compared in a computer (50) against reference digital values for the same circuit node of the same electronic circuit which is known to be good. If the digital signals are not within a selected range relative to the reference digital values, the analog signature of the circuit node is displayed for inspection and evaluation by an operator.
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