Profile analyzer for filamentary materials
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United States of America Patent
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Aug 16, 1988
Grant Date -
N/A
app pub date -
Oct 27, 1986
filing date -
Oct 27, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A device for analyzing the characteristics of filamentary material while the filamentary material moves at high speed, and a method for using the device. The material is moved past a sensing array while a light shines against the array. The material will block the light to portions of the array; and, since the array is scanned by an electrical signal of high frequency, a width of the material will be indicated by the output signal. Successive scans, and successive widths, are stored in computer storage, and a profile of the material is constructed. Various statistical data can be computed, and a stop motion device can be activated in the event material is beyond preset standards.
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