Six-port reflectometer test arrangement
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United States of America Patent
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Sep 6, 1988
Grant Date -
N/A
app pub date -
Dec 31, 1986
filing date -
Jan 17, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test arrangement for testing high frequency electrical devices consists of two 6-port reflectometers which are both connected to a device under test. As well as being applied to the device under test, a reference sample of an excitation signal is routed to both 6-port reflectometers simultaneously. The test arrangement is capable of very wide operation and is able to fully characterize the electrical properties of a device.
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