Method and apparatus for improved monitoring and detection of improper device operation
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United States of America Patent
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-
Sep 20, 1988
Grant Date -
N/A
app pub date -
Oct 1, 1984
filing date -
Oct 1, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus is disclosed for the improved monitoring and detection of improper device operation. Operation of a prototype device is first modeled. In particular, a set of test vectors is selected to provide a desired degree of testing of the prototype unit. The expected response of the prototype to the selected set of test vectors is determined through the use of analytical prediction means, and stored for subsequent comparison with the operation of the prototype unit. Thereafter, the selected set of test vectors are applied to the prototype unit, and the response thereto compared in real time with the expected responses. Improper operation of the prototype device is thereby identified, and associate information recorded for subsequent analysis.
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