Method of manufacturing wafers of semiconductor material

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United States of America Patent

PATENT NO 4773951
SERIAL NO

06816923

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of manufacturing wafers of semiconductor material incorporates the steps of: providing an elongated ingot of semiconductor material having a curved surface along the direction of elongation; mounting a structure for ingot mounting on each of the end surfaces of the ingot; positioning the ingot mounting structures on fixture structures to mount the ingot; and rotating the mounted ingot. The positioned ingot mounting structures are released and the ingot is removed from the fixture structures; however, during the course of the process the mounting structures are again positioned on fixture structures to mount the ingot and the ingot is rotated a second time. The method is adapted for accurate centering of the ingot during processing involving the sawing of the ingot to provide opposed elongated planes therealong (including rotation of the ingot in accomplishing such) and involving further rotation of the ingot during grinding. The ingot mounting structures are centered on the basis of crystallographic node lines that appear on the grown ingot. The mounting structures have spherical surface portions for accuracy in centering the ingot in fixtures having conical surface portions to abut the spherical surfaces in mounting the ingot.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS SOLAR INDUSTRIES L P4650 ADOHR LANE CAMARILLO CA 93012

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jackson, Richard C Oxnard, CA 12 226
Moffatt, Alex P Camarillo, CA 3 149

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