Photoeletric type measuring method and device
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United States of America Patent
Stats
-
Oct 18, 1988
Issued Date -
N/A
app pub date -
Mar 13, 1987
filing date -
Apr 14, 1982
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In a photoelectric type measuring method and device wherein a workpiece to be measured is scanned by parallel scanning ray beams for scanning in one direction, aforesaid ray beams after the scanning are received by light receiving elements and a time length of a dark portion or a bright portion generated due to the obstruction of a portion of the ray beams by workpiece to be measured in response to output signals from the light receiving elements is detected so as to obtain the dimension in the scanning direction of the workpiece to be measured, the aforesaid ray beams are split into ray beams polarized in directions different from each other, the workpiece to be measured is scanned in such a condition that the two ray beams are relatively shifted so that the two ray beam may be partially overlapped in the scanning directions thereof and light receiving signals corresponding to the two ray beams after the scanning are processed to detect and edge of the workpiece to be measured.
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