Electrical interface arrangement
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 25, 1988
Grant Date -
N/A
app pub date -
Sep 23, 1987
filing date -
Sep 23, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In an interface arrangement for automatic test equipment a substrate, such as a circuit board, is supported between spring loaded test probes within a vacuum chamber so that application of a vacuum causes the probes to contact the board. An internal dam is mounted within the vacuum chamber and, upon the application of the vacuum, seals off an internal portion of the chamber containing the probe arrays so that cooling air may be applied to the circuit board without breaking the vacuum in the outer portion of the chamber. Access may also be provided to the circuit board in this condition.
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