Wideband high impedance card mountable probe
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United States of America Patent
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-
Nov 8, 1988
Issued Date -
N/A
app pub date -
Mar 14, 1988
filing date -
Aug 21, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An active electrical test probe with wideband frequency capability for use on a test probe card, along with other test probes. A small hybrid integrated circuit is mounted on a substrate held on edge, adjacent the probe tip contact element of the probe, by a conductive metal clip. The circuit is provided power from an external source. Signals received by the probe tip are transmitted, as modified by the hybrid integrated circuit, through an output cable to electronic test equipment.
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