In-circuit testing system
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United States of America Patent
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Dec 13, 1988
Grant Date -
N/A
app pub date -
Sep 19, 1986
filing date -
Sep 19, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform to restimulate the same device in a subsequent in-circuit test.
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