Sub-nyquist interferometry
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United States of America Patent
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Dec 13, 1988
Grant Date -
N/A
app pub date -
Oct 15, 1986
filing date -
Oct 15, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A technique is described for extending the measurement range of interferometry past the Nyquist limit of the sampling frequency of the interferogram. The absolute phase values measured by an interferometer are reconstructed by applying constraints based upon a priori knowledge of the absolute phase values. The constraints include the knowledge that one or more derivatives of the spatial distribution of phase values is a continuous function, and the knowledge of step heights to within .lambda./2.
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