Method and apparatus for non-contacting identification of the temperature distribution in an examination subject
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 17, 1989
Grant Date -
N/A
app pub date -
Jan 9, 1987
filing date -
Jan 23, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and apparatus for undertaking a non-contacting measurement of the three-dimensional temperature distribution in a non-uniform examination subject direct microwave radiation at the examination subject, detect the three-dimensional phase and amplitude of microwave radiation which is attenuated and scattered by the examination subject, and calculate the three-dimensional dielectric constant distribution in the examination subject on the bases of the detected phase and amplitude values. In a separate step the characteristic thermal radiation of object is measured, too. The three-dimensional temperature distribution of the examination subject is then calculated from both the three-dimensional dielectric constant distribution data and the characteristic thermal readiation data of a selected location.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully