Method of dry etching aluminum

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United States of America Patent

PATENT NO 4798650
SERIAL NO

07174348

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Abstract

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A method of reactive ion etching (RIE) of aluminum or an alloy thereof (Al) in which a substrate with an Al layer coated thereon is maintained at a temperature of 60.degree. C. or less by cooling the substrate, so that the Al layer is taperingly etched to form conductor lines having sloped sidewalls. The substrate is clamped to a cooled electrode stage by an electrostatic chuck.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU MICROELECTRONICS LIMITED7-1 NISHI-SHINJUKU 2-CHOME SHINJUKU-KU TOKYO 163-0722

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kurimoto, Takashi Kawasaki, JP 12 212
Nakamura, Moritaka Yokohama, JP 20 324

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