Sheet inspection apparatus and methods providing simultaneous resolution of measurement zones and wavelength bands
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United States of America Patent
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Jan 31, 1989
Grant Date -
N/A
app pub date -
Jul 13, 1987
filing date -
Jul 13, 1987
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Disclosed are sheet inspection apparatus and methods for rapid, repetitive measurement of a quality attribute in each of a plurality of measurement zones of a continuously-manufactured sheet of material, wherein measurement is based on the interaction of one or more radiation wavelength bands with one or more constituents of the sheet. Simultaneous resolution of measurement zones is provided in both scanning and non-scanning applications.
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