Apparatus and methods for improving uniformity measurements
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United States of America Patent
Stats
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Feb 14, 1989
Grant Date -
N/A
app pub date -
Jun 12, 1987
filing date -
Jun 12, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Apparatus and methods for use in measuring the uniformity of a body such as a tire, wheel or the like wherein a waveform related to the uniformity of the body is digitally sampled to acquire a series of data samples, each of which is correlated with a respective physical location on the body. According to a first aspect of the invention, a non-repetitive error component of the waveform is corrected for by sampling the same location on the body at two different times and determining the difference between the corresponding data samples. A part of the total difference is allocated to each of the data samples in the series according to a predetermined methematical function which at least approximately describes the non-repetitive component of the waveform. The part of the difference allocated to each sample is then subtracted from it to obtain a corrected series of data sample. According to a second aspect of the invention, the maximum, minimum and/or peak-to-peak values of the waveform are more accurately determined by relating selected extreme data samples and one or more data samples adjacent thereto to a polynomial function of at least second order. The function is then evaluated at the location where its first derivative equals zero to determine a more accurate and repeatable approximation of a maximum, minimum or peak-to-peak value of the waveform. According to yet another aspect of the present invention the first and second aspects above are practiced in conjunction with one another.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
MICRO-POISE MEASUREMENT SYSTEMS LLC A DELAWARE LIMITED LIABILITY COMPANY | 1624 ENGLEWOOD AVENUE AKRON OH 44305-4205 |
International Classification(s)

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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Beebe, James C | Medina, OH | 19 | 259 |
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Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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