Metrological apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4807152
SERIAL NO

07020436

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Metrological apparatus, particularly for measuring form, has a turntable 4 and a transducer 14 and associated stylus 12 mounted so that the tip 12a of the stylus is displaceable radially and vertically relative to the turntable 4. The problem of obtaining both high resolution and large range of operation is solved by using a transducer/stylus 12,14 having a resolution of 12 nanometers and a range of only 0.4 mm and mounting the transducer 14 on an arm 10 which is driven radially and/or vertically by a computer 30 in response to the output from the transducer 14 to cause the stylus 12 to follow the workpiece surface. High resolution data defining the rotary position of the turntable 4 and the radial and vertical position of the transducer 14 is provided by a photodetector/optical grating arrangement 23, 21, 31; 27, 19, 43 and associated interpolators 42, 44, 46. A novel computer architecture comprising a host 22, master 30 and slaves 33, 35, 37 provides an efficient system for controlling the apparatus and gathering data. Efficient gathering of data is further assisted by the provision of means to cause the stylus 12 to traverse the surface of the workpiece at a constant speed, particularly as a function of the radial position of the transducer.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
Rank Taylor Hobson LimitedLEICESTER1
Taylor Hobson LimitedLEICESTER21

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lane, Hugh R Leicester, GB 1 56
Onyon, Peter D Loughborough, GB 3 65

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
* 4630215 Machine tool tracer assembly and control system 7 1983
 
WESTERN DIGITAL TECHNOLOGIES, INC. (1)
8102627 Slider suspension assembly having limiter tab passing through load beam hole both within slider silhouette 3 2007
 
Mitsubishi Jukogyo Kabushiki Kaisha (1)
* 4702652 Advanced memory type profiling control method for a machine tool 11 1985
 
Mauser-Werke Oberndorf GmbH (1)
* 4483079 Coordinate measuring apparatus 16 1982
 
Digital Electronics Automation, Inc. (1)
* 4663852 Active error compensation in a coordinated measuring machine 50 1985
 
Ernst Leitz Wetzlar GmbH (2)
* 4283669 Process and apparatus for the automatic measuring of a workpiece 5 1980
* 4455755 Apparatus for sensing test values at test samples 16 1982
 
Ferranti plc (1)
* 4691446 Three-dimensional position measuring apparatus 43 1986
 
RENISHAW PLC (1)
* 4702013 Probe for sensing contact via acceleration 21 1986
 
PPG INDUSTRIES, INC. (1)
* 4679331 Apparatus and method for determining contour characteristics of a contoured article 144 1985
 
ALUMINIUM PECHINEY (1)
* 4581062 Process for the continuous purification of metals by fractional crystallization on a rotary drum 10 1985
 
KLINGELNBERG SOHNE KG (1)
* 4621434 Multiple-coordinate scanner with regulated scanning force 23 1984
 
MITSUBISHI DENKI KABUSHIKI KAISHA (1)
* 4483293 Ignition time control device 10 1983
 
Carl-Zeiss-Stiftung (1)
* 4587622 Method and apparatus for determining and correcting guidance errors 44 1982
 
Mitutoyo Mfg. Co., Ltd. (3)
* 4653011 Method of measuring by coordinate measuring instrument and coordinate measuring instrument 153 1985
* 4665739 Surface roughness measuring instrument 16 1985
* 4631834 Coordinate measuring instrument 52 1985
* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (2)
* 5875286 Automated tissue assay using standarized chemicals and packages 43 1997
* 2006/0093,520 Automated molecular pathology apparatus having fixed slide platforms 1 2005
 
Dipl.-Ing Wolfgang Zwicker GmbH & Co. (1)
* 4967481 Alignable sensor 1 1989
 
GILLEN, GRACE MS. (1)
* 5198990 Coordinate measurement and inspection methods and apparatus 29 1990
 
System E. Controls Limited (1)
* 5465496 Measuring apparatus and method 11 1994
 
KAWASAKI JUKOGYO KABUSHIKI KAISHA (1)
* 5214748 Robot teaching/playback system 4 1991
 
Renault Automation (1)
* 5012587 Machine for measuring by coordinates 2 1990
 
Bio Tek Instruments (1)
* 5355439 Method and apparatus for automated tissue assay 123 1991
 
HEXAGON METROLOGY, INC. (1)
* 4972090 Method and apparatus for measuring and inspecting articles of manufacture for configuration 49 1989
 
VENTANA MEDICAL SYSTEMS, INC. (16)
* 5675715 Method and apparatus for automated tissue assay 84 1994
* 5696887 Automated tissue assay using standardized chemicals and packages 87 1994
6594537 Automated tissue assay using standardized chemicals and packages 81 1998
7270785 Automated molecular pathology apparatus having fixed slide platforms 33 2002
7303725 Automated high volume slide staining system 55 2003
* 2004/0002,163 Automated high volume slide staining system 35 2003
7378055 Automated molecular pathology apparatus having fixed slide platforms 50 2003
* 2003/0203,493 Automated molecular pathology apparatus having fixed slide platforms 30 2003
7468161 Automated high volume slide processing system 35 2005
* 2005/0186,114 Automated high volume slide processing system 32 2005
8663991 Automated high volume slide processing system 1 2005
* 2005/0250,211 Automated high volume slide processing system 29 2005
7404927 Automated molecular pathology apparatus having fixed slide platforms 31 2005
8048373 Automated high volume slide staining system 4 2007
* 2008/0038,836 AUTOMATED HIGH VOLUME SLIDE STAINING SYSTEM 3 2007
9528918 Automated high volume slide processing system 0 2013
 
CORNING INCORPORATED (1)
* 7140119 Measurement of form of spherical and near-spherical optical surfaces 13 2004
 
FUJI JUKOGYO KABUSHIKI KAISHA (1)
* 6564466 Measuring apparatus for pulley 3 2001
 
IMMERSION CORPORATION (7)
* 6134506 Method and apparatus for tracking the position and orientation of a stylus and for digitizing a 3-D object 123 1996
* 6078876 Method and apparatus for tracking the position and orientation of a stylus and for digitizing a 3-D object 75 1996
* 6015473 Method for producing a precision 3-D measuring apparatus 19 1996
* 6125337 Probe apparatus and method for tracking the position and orientation of a stylus and controlling a cursor 104 1998
6697748 Digitizing system and rotary table for determining 3-D geometry of an object 28 2000
7054775 Digitizing system and rotary table for determining 3-D geometry of an object 3 2004
* 2004/0162,700 Digitizing system and rotary table for determining 3-D geometry of an object 34 2004
 
VERVE, L.L.C. (1)
* 5410817 Measuring tool with concentric point 5 1993
 
DISCOVERY TECHNOLOGY INTERNATIONAL, LLLP (1)
* 7395607 Rotational and translational microposition apparatus and method 7 2006
 
NEW YORK UNIVERSITY (1)
* 5208763 Method and apparatus for determining position and orientation of mechanical objects 139 1990
 
MITUTOYO CORPORATION (8)
* 5694339 Roundness measuring apparatus 12 1996
7373807 Drive unit 1 2006
7363181 Straightness correcting method for surface texture measuring instrument, and surface texture measuring instrument 2 2006
* 2006/0191,328 Straightness correcting method for surface texture measuring instrument, and surface texture measuring instrument 0 2006
* 8161657 Measuring force control apparatus 2 2010
* 2011/0088,273 MEASURING FORCE CONTROL APPARATUS 2 2010
* 9103648 Profile measuring method and profile measuring instrument 2 2013
* 2013/0283,627 PROFILE MEASURING METHOD AND PROFILE MEASURING INSTRUMENT 2 2013
 
GENERAL ELECTRIC COMPANY (3)
* 5224272 Rotary runout measuring system 15 1991
* 5309646 Tool point compensation for hardware displacement and inclination 18 1993
* 5563808 Pilger mill mandrel measuring device 2 1993
 
BROWN & SHARPE DEA SPA (1)
* 5148372 Interactive graphic system for the mathematical representation of physical models 11 1988
 
Taylor Hobson Limited (7)
* 5150314 Metrological apparatus and calibration method therefor 38 1990
* 5926781 Roundness measuring 20 1997
* 6401349 Surface measuring apparatus 8 1998
* 6505141 Transducer circuit 4 2001
* 8051576 Metrological apparatus for measuring surface characteristics 1 2007
* 8635783 Surface measurement instrument and method 0 2009
* 2011/0258,867 SURFACE MEASUREMENT INSTRUMENT AND METHOD 1 2009
 
MICROSCRIBE, LLC (1)
6195618 Component position verification using a probe apparatus 9 1998
 
KLINGELNBERG AG (2)
* 7735233 Measuring apparatus for heavy workpieces and workpiece receiver for such a measuring apparatus 0 2008
* 2009/0112,508 MEASURING APPARATUS FOR HEAVY WORKPIECES AND WORKPIECE RECEIVER FOR SUCH A MEASURING APPARATUS 1 2008
 
REVWARE, INC. (1)
6408253 Component position verification using a position tracking device 15 2001
 
TOKYO SEIMITSU CO., LTD. (5)
* 6742273 Workpiece measuring apparatus 1 2002
* 2004/0040,168 Workpiece measuring apparatus 1 2002
* 7197835 Detector supporting mechanism 4 2005
* 2006/0101,660 Detector supporting mechanism 3 2005
9581424 Roundness measuring apparatus 0 2014
 
COMMERCIAL COPY INNOVATIONS, INC. (1)
* 6295737 Apparatus and method for marking a contoured surface having complex topology 30 2001
 
M&M Precision Systems Corporation (1)
* 5505003 Generative measuring system 62 1994
 
EASTMAN KODAK COMPANY (1)
* 6578276 Apparatus and method for marking multiple colors on a contoured surface having a complex topography 13 2001
 
NUTEC COMPNENTS, INC. (1)
* 6260285 Precision workpiece positioning device 3 1999
 
TOKYO ELECTRON LIMITED (1)
* 4950982 Electric probing test machine 12 1990
* Cited By Examiner