Six-port reflectometer test arrangement and method including calibration
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United States of America Patent
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Feb 28, 1989
Grant Date -
N/A
app pub date -
Dec 31, 1986
filing date -
Jan 17, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test arrangement for testing high frequency electrical devices consisting of two 6-port reflectometers which are both connected to a device under test. In order to calibrate the test arrangement, an arbitrary termination generator is connected to each test port while its test signal represents a reflectivity coefficient of greater than unity, so that it simulates active devices as well as passive ones.
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